Infraestructure and facilities
FEI - TECNAI G2 F20 S-TWIN
The FEI Tecnai G2 is a 200kV field emission gun (FEG) high resolution TEM/STEM, which was installed at CIC EnergiGUNE in 2010, enabling you to solve a wide variety of materials science challenges in an easy and fast way. This electron microscopy excels in versatility and flexibility by combining high performance in all TEM, EFTEM, Lorentz, STEM and EDX/EELS spectrum imaging modes. The key feature of this microscope is the low energy spread of the electron beam (0.7 eV@200kV or less) which combined with the SuperTwin objective lens with a Cs of 1.2 mm, allows the determination of the electronic properties at atomic resolution
FEI - Quanta 200FEG
Our Quanta 200 FEG (FEI) scanning electron microscope (SEM) was installed at CIC EnergiGUNE in the winter of 2010. It is a high resolution environmental microscope capable of running in 3 different modes: high vacuum, variable pressure and environmental modes, which means that it can handle all specimens even uncoated, non‒conductive samples as well as wet samples that require being above the vapor pressure of water. The combination of high output thermal field emission (> 100nA beam current) with a high sensitivity (18 mm) allows get final resolution until 3‒5 nm. The presence of a backscatter detector also will allow us measure electronic properties like the atomic contrast in our samples. The working voltages of the Quanta 200 FEG (FEI) scanning electron microscope vary between 3kV (low vacuum mode) and 30 kV (high vacuum mode). One key of our Quanta 200 FEG (FEI) SEM is that is it possible work at very low electron probe energies providing images of samples exhibiting low conductivities.